Hioki Automatic Test Equipment

Fixture Type for Board Assembly Fixture Type for HDI Substrates Flying Probe Type for Board Assembly Flying Probe Type for PWB/HDI Substrates

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	Fixture Type for Board Assembly Model Description 1105-01 Detection of Reversely Mounted Electrolytic Capacitors (Off-line type) 1105-11 Detection of Reversely Mounted Electrolytic Capacitors (In-line type) 1220-00 In-Circuit HiTester (Bench-top Type) 1220-01 In-Circuit HiTester (Off-line Type) 1220-02 In-Circuit HiTester (Space-Saving Type) Back to top
	Fixture Type for HDI Substrates Model Description 1107-01 High-speed O/S test for HDI substrates, Single Shuttle Model 1107-02 High-speed O/S test for HDI substrates, Double Shuttle Model 1107-20 Multi-functional insulation/continuity tester, equipped with microshort testing and high current application functions (Test points: maximum of 2048 channels) (Low L-C measurement (with option)) 1107-21 Multi-functional insulation/continuity tester, equipped with microshort testing and high current application functions (Test points: maximum of 4096 channels) (Low L-C measurement (with option)) 1107-30 Multi-functional insulation/continuity tester, equipped with microshort testing and high current application functions (Test points: maximum of 4096 channels) (Low L-C measurement (with option)) 1107-31 Multi-functional insulation/continuity tester, equipped with microshort testing and high current application functions (Test points: maximum of 8192 channels) (Low L-C measurement (with option)) 1107-51 High-speed O/S test for HDI substrates of fine-pitch boards 1107-60 High-speed pattern testing for fine pitch packages. A standard four-terminal measurement function. Double sided alignment. (Unit testing) 1107-61 High-speed pattern testing for fine pitch packages. A standard four-terminal measurement function. Double sided Alignment. (Step&Repeat) 1108-01 Tests panels with up to 3000 images. High-speed O/S test (One-Sided Alignment) 1108-02 Tests panels with up to 3000 images. High-speed O/S test (Double Sided Alignment) 1109 TDR test of high-speed, high-frequency boards. From IC packages to MCMs Back to top
	Flying Probe Type for Board Assembly Model Description 1114 IC lead poor contact detection using 4-terminal connection Back to top
	Flying Probe Type for PWB/HDI Substrates Model Description 1116 Four-arm, High-speed type 0.015 s/step at maximum speed 1116-12 Four-arm, High-speed type 0.015 s/step at maximum speed CE Mark Product 1116-21 Two-arm, Middle-speed type 0.022 s/step at maximun speed High cost performance (Off-line) 1116-22 Two-arm, Middle-speed type 0.022 s/step at maximun speed High cost performance (Transport System : Single-robot) 1116-23 Two-arm, Middle-speed type 0.022 s/step at maximun speed High cost performance (Off-line, with 1945-21 and 1945-22) 1116-24 Two-arm, Middle-speed type 0.022 s/step at maximun speed High cost performance (Transport System : Single-robot, with 1945-21 and 1945-22) 1116-51 Two-arm, Ultra high-speed type 0.014 s/step at maximum speed (Off-line Type) 1116-52 Two-arm, Ultra high-speed type 0.014 s/step at maximum speed (Transport System : Single-robot) 1116-53 Two-arm, Ultra high-speed type 0.014 s/step at maximum speed (Off-line, with 1945-21 and 1945-22) 1116-54 Two-arm, Ultra high-speed type 0.014 s/step at maximum speed (Transport System : Single-robot, with 1945-21 and 1945-22) 1116-71 Astonishingly fast 100 steps/s maximum ultra-highspeed inspection (Off-line Type) 1116-72 Astonishingly fast 100 steps/s maximum ultra-highspeed inspection (Transport System : Single-robot) 1116-73 Astonishingly fast 100 steps/s maximum ultra-highspeed inspection (Off-line, with 1945-21 & 1945-22) 1116-74 Astonishingly fast 100 steps/s maximum ultra-highspeed inspection (Transport System : Single-robot, with 1945-21 & 1945-22) 1116-75 Astonishingly fast 100 steps/s maximum ultra-highspeed inspection (Transport System : Double-robot, with 1945-21 & 1945-22) 1117 Test Speed Enhanced by Simultaneous Four-Arm, Dual-Sided Action 0.015 s/step at maximum speed 1118-01 Merging of the Flying Probe and Fixture, MAX. 100 times/sec High-speed Inspection (Double Shuttle) 1118-11 Merging of the Flying Probe and Fixture, MAX. 100 times/sec High-speed Inspection (Single Shuttle) 1270 Superior cost effectiveness Dual-Sided Bare Board Tester (Board size : 50 × 50 to 400 × 330mm) 1271 Superior cost effectiveness Dual-Sided Bare Board Tester (Board size : 50 × 70 to 610 × 510mm) Back to top

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