The 1116 X-Y C HiTester is a high-speed substrate tester that uses capacitance measurement to greatly reduce the number of testing steps and time required for testing compared to testers that use continuity testing. With four arms, the new 1116 can test at speeds as great as 0.015 s/step, and can detect extremely small changes at a high resolution of 5aF during capacitance measurement. The 1116 X-Y C HiTester is a non-fixture testing apparatus which not only yields very low running costs, but also has a high-speed soft landing function that minimizes impressions resulting from probe impact. Because there are no restrictions on board type, it can be used for testing plastic, ceramic, and liquid crystal glass panels.

With four arms, the 1116 X-Y C HiTester can test at speeds as great as 0.015 s/step. (with 0.15 mm movement and all four arms used simultaneously during capacitance measurement)

Each printed circuit pattern has a particular capacitance, proportional to its area, with respect to the electrically insulated electrode used for testing. If there are circuit breaks, or shorts, then the area of the pattern will differ, and the capacitance will change correspondingly. Therefore, by comparing the capacitance values with those of a reference board, the pattern can be checked for continuity. Since the floating capacitance of the pattern is extremely low, a special-purpose jig with vacuum clamping is used to obtain stable measurement values.