The 1116 X-Y C HiTester is a high-speed substrate tester that uses capacitance measurement to greatly reduce the number of testing steps and time required for testing compared to testers that use continuity testing. The 1116 series is available in three versions: the astonishingly fast ultra-high speed 1116-70, which operates at up to 100 steps/s; the ultra-high speed 1116-50, which operates at up to 70 steps/s; and the low-cost 1116-20. With a capacitance measurement resolution of 5aF , the 1116 X-Y C HiTester can detect extremely small variations with accuracy and certainty. In addition to its extremely low running cost, this fixtureless inspection unit has a high-speed soft landing function to minimize denting. Further, it can be used for any board material regardless of composition, be it plastic, ceramic, or LCD glass.

Each printed circuit pattern has a particular capacitance, proportional to its area, with respect to the electrically insulated electrode used for testing. If there are circuit breaks, or shorts, then the area of the pattern will differ, and the capacitance will change correspondingly. Therefore, by comparing the capacitance values with those of a reference board, the pattern can be checked for continuity. Since the floating capacitance of the pattern is extremely low, a special-purpose jig with vacuum clamping is used to obtain stable measurement values.